Field-Effect Transistor on SrTiO3 with sputtered Al2O3 Gate Insulator
K.Ueno, I.H.Inoue, H.Akoh, M.Kawasaki, Y.Tokura, H.Takagi

TL;DR
This paper reports the fabrication and characterization of a SrTiO3-based field-effect transistor with an amorphous Al2O3 gate insulator, demonstrating room-temperature operation and temperature-dependent mobility behavior.
Contribution
It introduces a novel SrTiO3 FET fabricated with sputtered Al2O3 insulator at room temperature, showing promising electrical characteristics.
Findings
FE mobility of 0.1cm2/Vs at room temperature
On-off ratio exceeds 100 at room temperature
Mobility exhibits thermal activation behavior down to 2K
Abstract
A field-effect transistor that employs a perovskite-type SrTiO3 single crystal as the semiconducting channel is revealed to function as n-type accumulation-mode device with characteristics similar to that of organic FET's. The device was fabricated at room temperature by sputter-deposition of amorphous Al2O3 films as a gate insulator on the SrTiO3 substrate. The field-effect(FE) mobility is 0.1cm2/Vs and on-off ratio exceeds 100 at room temperature. The temperature dependence of the FE mobility down to 2K shows a thermal-activation-type behavior with an activation energy of 0.6eV.
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