Probe-configuration dependent dephasing in a mesoscopic interferometer

TL;DR

This paper investigates how dephasing in a mesoscopic interferometer depends on probe configuration, revealing that voltage fluctuations in the measurement circuit are the key factor, aligning with recent experimental findings.

Contribution

It demonstrates the dependence of dephasing rates on probe configuration and identifies voltage fluctuations as the main cause.

Findings

Dephasing rate varies with probe configuration.

Voltage fluctuations are the primary source of dephasing dependence.

Results agree with recent experimental observations.

Abstract

Dephasing in a ballistic four-terminal Aharonov-Bohm geometry due to charge and voltage fluctuations is investigated. Treating two terminals as voltage probes, we find a strong dependence of the dephasing rate on the probe configuration in agreement with a recent experiment by Kobayashi et al. (J. Phys. Soc. Jpn. 71, 2094 (2002)). Voltage fluctuations in the measurement circuit are shown to be the source of the configuration dependence.