Microscopic Method for Dislocation Tracking
M. Patriarca, M. Robles, K. Kaski

TL;DR
This paper introduces a microscopic approach using mean single-particle potential energy to detect, visualize, and track the evolution of crystal defects at the atomic level.
Contribution
It presents a novel microscopic definition of crystal defects and an algorithm for their detection and tracking over time.
Findings
Effective visualization of local and extended defects
Successful tracking of defect evolution
Potential for improved crystal defect analysis
Abstract
We show that a microscopic definition of crystal defect, based on the effective mean single-particle potential energy, makes it possible to detect and visualize various types of local and extended crystal defects and develop an effective algorithm for tracking their time evolution.
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Taxonomy
TopicsMetal and Thin Film Mechanics · Electron and X-Ray Spectroscopy Techniques
