Comments on "A model for fatigue in ferroelectric perovskite thin films" published in Appl. Phys. Lett, 76, 1060 (2000); addendum, ibid. p.3655

TL;DR

This paper critically examines Dawber and Scott's model on oxygen vacancies' role in ferroelectric thin film fatigue, questioning its assumptions, calculations, and conclusions based on available experimental data.

Contribution

It provides a detailed critique of the existing model, highlighting potential inaccuracies and questioning its validity in explaining polarization fatigue.

Findings

Questions the assumptions and calculations of the original model.

Highlights discrepancies between model predictions and experimental data.

Suggests the need for revised models or further experimental validation.

Abstract

The paper comments on a paper by Dawber and Scott published in Appl. Phys. Lett, 76,1060 (2000) and addendum (ibid. p.3655), which addresses an important issue of the physics of ferroelectric thin films - the role of oxygen vacancies in polarization fatigue. It is shown that the content of this paper (starting equations, calculations, parameters used in calculations and the way the obtained results are compared to the experimental data available in the literature) enables questioning the results and conclusions reported in it.