Strongly Correlated Fractional Quantum Hall Line Junctions

TL;DR

This paper investigates the transport properties of a finite-length line junction between fractional quantum Hall edge channels with different filling factors, revealing how inter-edge correlations influence conductance and tunneling behavior.

Contribution

It provides exact solutions for low-lying excitations and transport in a novel fractional quantum Hall line junction with Coulomb interactions and external lead effects.

Findings

Inter-edge correlations significantly alter conductance.

Power-law behavior in current-voltage characteristics is affected.

Charging effects from external leads are fully incorporated.

Abstract

We have studied a clean finite-length line junction between interacting counterpropagating single-branch fractional-quantum-Hall edge channels. Exact solutions for low-lying excitations and transport properties are obtained when the two edges belong to quantum Hall systems with different filling factors and interact via the long-range Coulomb interaction. Charging effects due to the coupling to external edge-channel leads are fully taken into account. Conductances and power laws in the current-voltage characteristics of tunneling are strongly affected by inter-edge correlations.