Temperature induced shift in the pinch-off voltage of mesoscopic devices
A.E. Hansen, A. Kristensen, H. Bruus

TL;DR
This study reveals a universal temperature-induced downward shift in the pinch-off voltage of mesoscopic GaAs devices, originating from the surrounding 2D electron gas, observed across various structures and measurement setups.
Contribution
It uncovers a previously unreported thermal effect on conductance characteristics in mesoscopic GaAs devices, emphasizing the role of the surrounding 2D electron gas.
Findings
Shift in gate voltage with temperature up to 10 K
Universal effect across different device structures
Originates from surrounding 2D electron gas
Abstract
Detailed experimental studies of the conductance of mesoscopic GaAs devices in the few-mode regime reveal a novel thermal effect: for temperatures up to at least 10 K the measured gate characteristics, i.e. conductance versus gate voltage , exhibit a systematic downward shift in gate voltage with increasing temperature. The effect is 'universal', in the sense that it is observed in different modulation doped GaAs/GaAlAs heterostructures, in different device geometries, and using different measurement setups. Our observations indicate that the effect originates in the surrounding 2D electron gas and not in the mesoscopic devices themselves.
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Taxonomy
TopicsElectronic and Structural Properties of Oxides · Quantum and electron transport phenomena · Semiconductor materials and devices
