Perturbation Method in the Analysis of thin deformed Films and the possible Application

TL;DR

This paper introduces a perturbation method for analyzing deformed thin films, revealing directional dependence of exciton effective mass and proposing their use as infrared emitters under mechanical deformation.

Contribution

It presents a novel perturbation approach to analyze deformed thin films and explores their potential as infrared radiation sources due to mechanical deformation effects.

Findings

Excitons in deformed films have direction-dependent effective mass.

Mechanical deformation can induce periodic infrared emission.

The perturbation method effectively analyzes film deformation effects.

Abstract

The perturbation method for the analysis of thin, manifestly deformed films is given. The application of the method the excitons in the film has shown that those have the effective mass essentially depending on the propagation direction. The effects of a mechanical deformation of the film were investigated. It was concluded that the film could serve as an emiter of infrared radiation if the mechanical deformation periodically changes in time.