Inter edge Tunneling in Quantum Hall Line Junctions
Eun-Ah Kim (UIUC), Eduardo Fradkin (UIUC)

TL;DR
This paper models tunneling in quantum Hall line junctions as coupled chiral Luttinger liquids, explaining experimental zero-bias conductance peaks and their dependence on filling factor, interactions, and temperature.
Contribution
It introduces a theoretical framework for understanding tunneling features in quantum Hall systems using coupled Luttinger liquids, accounting for interaction effects and spin considerations.
Findings
Zero-bias conductance peak magnitude is proportional to the Luttinger parameter K.
The zero-bias peak appears abruptly near certain filling factors and diminishes with temperature.
Spin effects can cause reappearance of the zero-bias peak at higher filling factors.
Abstract
We propose a scenario to understand the puzzling features of the recent experiment by Kang and coworkers on tunneling between laterally coupled quantum Hall liquids by modeling the system as a pair of coupled chiral Luttinger liquid with a point contact tunneling center. We show that for filling factors the effects of the Coulomb interactions move the system deep into strong tunneling regime, by reducing the magnitude of the Luttinger parameter , leading to the appearance of a zero-bias differential conductance peak of magnitude at zero temperature. The abrupt appearance of the zero bias peak as the filling factor is increased past a value , and its gradual disappearance thereafter can be understood as a crossover controlled by the main energy scales of this system: the bias voltage , the crossover scale , and the temperature . The…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsQuantum and electron transport phenomena · Magnetic Field Sensors Techniques · Surface and Thin Film Phenomena
