Dynamic response of the dielectric and electro-optic properties of epitaxial ferroelectric thin films
B. H. Hoerman, B. M. Nichols, B. W. Wessels (Department of, Materials Science, Engineering, Northwestern University, Evanston, IL USA)

TL;DR
This paper models the dynamic dielectric and electro-optic responses of ferroelectric thin films using a domain relaxation approach based on percolation theory, successfully matching experimental data over a wide timescale.
Contribution
It introduces a new relaxation model for ferroelectric thin films based on domain size distribution and percolation theory, explaining their dynamic response.
Findings
Model accurately describes polarization and birefringence transients
Qualitative agreement over 11 orders of magnitude in time
Applicable to KNbO3 thin films
Abstract
An analysis of the dynamic dielectric and electro-optic relaxation response of thin film ferroelectrics is presented. The analysis is based upon the relaxation of ferroelectric domains with a continuous distribution of sizes given by percolation theory. The resulting temporal response is described by the expression (t^-m) exp(-(t/tau)^beta). The analysis was applied to KNbO3 thin films. Measurements of the polarization, birefringence and dielectric transients show qualitative agreement with the model over 11 orders of magnitude in time.
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