A Percolative Model of Soft Breakdown in Ultrathin Oxides
C. Pennetta, L. Reggiani, Gy. Trefan
TL;DR
This paper presents a percolative model for soft breakdown in ultrathin oxides, analyzing resistance and noise fluctuations through Monte Carlo simulations, revealing non-Gaussian noise behavior before breakdown.
Contribution
It introduces a novel percolative framework to understand soft breakdown phenomena and noise characteristics in ultrathin oxide layers.
Findings
Increased noise and non-Gaussian fluctuations observed pre-breakdown
Monte Carlo simulations match experimental noise behavior
Model captures the interplay of two antagonistic percolation processes
Abstract
The degradation of ultrathin oxide layers in the presence of a stress voltage is modeled in terms of two antagonist percolation processes taking place in a random resistor network. The resistance and leakage current fluctuations are studied by MonteCarlo simulations for voltages below the breakdown threshold. An increase of excess noise together with a noticeable non-Gaussian behavior is found in the pre-breakdown regime in agreement with experimental results.
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