# Full-Process Detection Technologies for Micro-LED Advanced Manufacture

## TL;DR

This paper reviews detection technologies for Micro-LED manufacturing, focusing on improving efficiency, accuracy, and cost-effectiveness.

## Contribution

The paper provides a comprehensive review of detection methods across Micro-LED manufacturing stages and outlines future technological directions.

## Key findings

- Current electrical detection methods for Micro-LEDs are inefficient and costly.
- Detection efficiency and accuracy are critical for improving Micro-LED production yield.
- The paper identifies key indicators and methods for Micro-LED detection at various manufacturing stages.

## Abstract

With the continuous advancement of micro-light-emitting diode (Micro-LED) manufacturing technology, Micro-LED displays are poised to emerge as the next-generation display technology, making important strides in areas such as near-eye displays, large-scale high-definition devices, and flexible screens. Among the various technical challenges associated with Micro-LED displays, detection plays a crucial role in identifying defective pixels, improving yield, and reducing overall production costs. Given that Micro-LED chip arrays often consist of millions of tiny chips (<50 μm), existing electrical detection methods face limitations such as low efficiency and high costs. As a result, enhancing detection efficiency, improving accuracy, and reducing costs have become the key trends in the development of Micro-LED detection technology. This review first outlines the key indicators to be monitored during Micro-LED chip detection. It then provides an in-depth analysis of the various detection methods available at different stages of the manufacturing process. Finally, it concludes with a summary of the current state of Micro-LED detection technology and offers a forward-looking perspective on future technological advancements.