# Study and Mathematical Model of the Chemical Composition and Structure of the Compound Sb2(S1−xSex)3 Based on a Correlation of Data Obtained Through XRD and XPS Characterization

## TL;DR

This paper presents a mathematical model to evaluate the chemical composition of Sb2(S1−xSex)3, a material used in solar cells, by correlating XRD and XPS data.

## Contribution

A novel mathematical model is proposed to correlate XRD and XPS data for evaluating stoichiometric variations in Sb2(S1−xSex)3.

## Key findings

- XRD results show a systematic 2θ shift in crystalline peaks as sulfur content increases.
- XPS confirms the presence of Sb, Se, and S, with decreasing selenium content as sulfur increases.
- Trend curves fitted to the data elucidate the stoichiometric behavior of Sb2(S1−xSex)3.

## Abstract

In this work, a study of the chemical composition of the compound Sb2(S1−xSex)3 used in thin-film solar cell fabrication, based on correlating data obtained from XRD and XPS analyses, is presented. This approach enables us to propose a mathematical expression for evaluating stoichiometric variations in the material, showing how the variable x evolves as a function of the diffraction angle 2θ. To establish this model, we analyzed the most intense diffraction peak, corresponding to the (221) plane. To validate the proposed method, a series of Sb2(S1−xSex)3 thin films with different compositions were synthesized using RF-magnetron sputtering followed by conventional heat treatments in a controlled-atmosphere reaction furnace. The XRD results reveal a systematic 2θ shift in the crystalline diffraction peaks toward the positions of the binary precursor phases—from Sb2Se3 to Sb2S3—caused by the increased sulfur content during synthesis. XPS measurements confirm the presence of Sb, Se, and S, and high-resolution spectra indicate a decrease in selenium content as the sulfur fraction increases. These results allowed us to elucidate the stoichiometric behavior of antimony sulfoselenide Sb2(S1−xSex)3 using trend curves fitted to the characterization data.