# High-Stable Electric Field Integrated Optical Sensor Based on Reduced Lithium Niobate

## TL;DR

This paper introduces a high-stability electric field sensor using reduced lithium niobate, which improves long-term performance by reducing temperature-related issues.

## Contribution

The novel use of thermally reduced lithium niobate mitigates the pyroelectric effect, enhancing stability in integrated optical electric field sensors.

## Key findings

- The IOES showed no drift in optical path difference under applied voltage from 0 to 5 V.
- Calibration revealed a minimum relative error of 0.47%, indicating high accuracy.
- A third-degree polynomial model better fits the sensor's response than a linear model.

## Abstract

Integrated optical devices based on lithium niobate (LN) are pivotal in modern navigation systems, telecommunications, and sensing technologies. However, their practical implementation is critically limited by temperature-dependent and long-term operational instability, primarily attributed to the pyroelectric effect inherent in LN. This study addresses this challenge by investigating thermally reduced lithium niobate as a material platform to enhance the stability of integrated optical circuits, with a focus on integrated optical electric field sensors (IOES). We present the fabrication and comprehensive characterization of an IOES based on a Michelson interferometer design. Key performance metrics including optical loss, free spectral range, electro-optical sensitivity, and optical path difference were systematically evaluated. Notably, under normal climatic conditions, the optical path difference of the IOES demonstrated exceptional stability when subjected to an applied voltage ranging from 0 to 5 V, with no observable drift over time. Calibration of the IOES revealed a predominantly linear response, although a third-degree polynomial model provided a more precise fit to the experimental data. The minimum relative error achieved during calibration was 0.47%, underscoring the high accuracy of the device. Our results establish thermally reduced LN as a promising material platform for next-generation integrated optical devices. By mitigating the pyroelectric effect, this approach enables significant improvements in the long-term stability of IOES and other LN-based photonic components. These findings open avenues for the reliable deployment of integrated optical systems in demanding applications where environmental stability is paramount.