Construction of Atomically Thin Boron Films on Si Heterojunctions Using a First Principles Approach
Piet Xiaowen Fang, Stoyan Nihtianov, Changming Fang

TL;DR
This paper studies how boron films are structured on silicon substrates to improve photodetectors and semiconductor devices.
Contribution
The study reveals the atomic structure and electronic properties of boron/silicon interfaces using first principles simulations.
Findings
Boron atoms form (-B-Si-B-Si-) chains at the interface with silicon atoms.
Localized defect states at the Fermi level influence the electrical properties of the device.
The minimum thickness of boron films is predicted to be 1 to 2 nm.
Abstract
Deposition of amorphous boron (a-B) onto Si substrates via chemical decomposition of B2H6 molecules produces a-B/Si, heterojunctions which are the core parts of photodetectors used in vacuum ultraviolet (VUV) and potentially in extreme ultraviolet (EUV) lithography. However, fundamental questions regarding the limit on the thickness of the deposited a-B thin films and the intrinsic electronic nature of the B atoms adjacent to the Si substrate remain unanswered. Here we investigated the local structural and electronic properties of atomic-thin a-B layers at the Si{001} substrates using ab initio molecular dynamics (AIMD) techniques. The investigation revealed a rich variety of local chemical bonding and consequently interfacial electronic properties. For thin a-B layer(s)/Si systems, most of the a-B atoms at the interface formed (-B-Si-B-Si-) chains on the Si{001} surface. These B atoms…
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Taxonomy
TopicsBoron and Carbon Nanomaterials Research · Graphene research and applications · Silicon and Solar Cell Technologies
