Junctionless Silicon Nanowire Transistors without the Use of Impurity Doping
Soundarya Nagarajan, Dirk König, Ingmar Ratschinski, Giulio Galderisi, Somayeh Shams, Thomas Mikolajick, Daniel Hiller, Jens Trommer

TL;DR
This paper introduces a new type of silicon nanowire transistor that doesn't require traditional doping, offering better performance at low temperatures.
Contribution
The paper presents a novel doping-free method using defect-engineered SiO2 shells to create junctionless transistors with high performance at cryogenic temperatures.
Findings
The transistors achieve carrier densities comparable to highly doped devices (∼10¹⁸ cm⁻³) across a wide temperature range.
Field-effect mobilities increase significantly at lower temperatures, from 115 to 331 cm²/V·s.
The devices maintain a high on/off ratio (≥10⁶) and stable performance down to 77 K.
Abstract
With the shrinking dimensions of semiconductor structures reaching the nanoscale, conventional impurity doping techniques face several challenges due to their statistical nature, temperature dependence, and degradation in efficiency of the doping method. In addition, the cryogenic operation of highly doped transistors is complicated due to carrier freeze-out, which significantly reduces the availability of mobile charges, degrading device performance and inducing noise. Here, an innovative material solution is presented that enables silicon nanowire junctionless transistors without requiring impurity doping within the active semiconductor region. To this end, a SiO2 dielectric shell with deliberate defect engineering surrounding both the channel and the contact regions - known as direct modulation dopingis used to modify the nanoscale transport properties of the silicon. The obtained…
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Taxonomy
TopicsNanowire Synthesis and Applications · Advancements in Semiconductor Devices and Circuit Design · Thin-Film Transistor Technologies
