A graphene-coated AFM probe for durable and reproducible nanoscale electronic measurements
Xintai Wang, Angelo Lamantia, Becky Penhale-Jones, Nema Abdelazim, Oleg. V. Kolosov, Benjamin. J. Robinson

TL;DR
Researchers developed durable graphene-coated AFM probes that enable reliable and long-lasting nanoscale electronic measurements.
Contribution
A scalable fabrication method for graphene-coated cAFM probes using the Langmuir–Blodgett technique is introduced.
Findings
Graphene-coated probes show exceptional mechanical durability and stable electrical performance over extended use.
The probes yield reproducible conductance measurements and reduce short-circuit artifacts on self-assembled monolayers.
Electronic transport and thermoelectric measurements confirm the reliability of the graphene-coated probes.
Abstract
Conductive atomic force microscopy (cAFM) is a powerful tool for investigating electronic and thermoelectric properties at the nanoscale. However, the widespread application of cAFM is hindered by the rapid wear and unpredictable failure of metal-coated probes, leading to poor measurement reproducibility and limited probe lifetime. Here, we report a scalable fabrication method for graphene-coated cAFM probes using the Langmuir–Blodgett technique. These probes exhibit exceptional mechanical durability, including resistance to both friction-induced wear and high-current stressing, and maintain stable electrical performance over extended use. When applied to self-assembled monolayers (SAMs), the graphene-coated probes yield narrow conductance distributions, significantly improved measurement reproducibility across different probe batches, and a substantial reduction in short-circuit…
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Taxonomy
TopicsForce Microscopy Techniques and Applications · Molecular Junctions and Nanostructures · Electrochemical Analysis and Applications
