# Electro-Thermal Co-Design and Verification of TGV Transmission Structures for High-Power High-Frequency Applications

**Authors:** Luming Chen, Zhilin Wei, Shenglin Ma, Yan Chen, Yihan Xie, Chunlei Li, Shuwei He, Hai Yuan

PMC · DOI: 10.3390/mi17020253 · Micromachines · 2026-02-16

## TL;DR

This paper studies how to manage heat and electrical performance in high-power, high-frequency glass-based circuits.

## Contribution

The study introduces an electro-thermal co-design approach for TGV transmission structures under high-power conditions.

## Key findings

- Under continuous wave operation, temperature rises significantly but insertion loss increases minimally.
- Pulsed wave operation results in lower temperature rise due to thermal accumulation suppression.
- A quadruple-redundant design prevents localized hotspots by reducing heat flux density.

## Abstract

Through Glass Via (TGV) technology has emerged as a promising solution for advanced packaging. While glass offers lower dielectric loss than silicon, its lower thermal conductivity raises concerns about electro-thermal coupling effects in high-power, high-frequency applications. Therefore, this study conducted an electro-thermal co-design of TGV grounded Coplanar Waveguide (CPW) and Radio Frequency (RF) TGV connected CPW structures. A high-power test platform was developed to investigate the electrical and thermal performance of these structures. The temperature distribution mechanism under high-power conditions was revealed. Under high power and high frequency, the decrease in surface conductivity affected by surface state and film layer composition leads to increased loss, triggering temperature rise and forming an electrothermal coupling loop. Under continuous wave operation (5–20 W), the temperature rise reaches 92.4 °C while insertion loss increases by only 0.4 dB. Under pulsed wave operation (25–100 W, 2.5% duty cycle), the temperature rise is merely 2.1 °C with insertion loss increasing by 0.3 dB. The quadruple-redundant design and reduces heat flux density, preventing localized hotspot formation. The pulse intervals suppress thermal accumulation, leading to lower temperature rise. Therefore, continuous wave applications should prioritize thermal management, while pulsed wave applications can focus on electrical performance optimization.

## Full-text entities

- **Diseases:** injury to (MESH:D014947)
- **Chemicals:** Cu (MESH:D003300), palladium (MESH:D010165), nickel (MESH:D009532), metal (MESH:D008670), gold (MESH:D006046), PI (MESH:D010716), Mo (MESH:D008982), Ti (MESH:D014025), aluminum (MESH:D000535), silicon (MESH:D012825), BF33 (-)
- **Species:** Homo sapiens (human, species) [taxon 9606]
- **Mutations:** N1912A

## Full text

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## Figures

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## References

44 references — full list in the complete paper: https://tomesphere.com/paper/PMC12942756/full.md

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Source: https://tomesphere.com/paper/PMC12942756