# Correlated X‐Ray and Electron Microscopies of a Single Biphasic GaAs Nanowire

**Authors:** Thomas Dursap, Tao Zhou, Maxime Dupraz, Stéphane Labat, Olivier Thomas, Niels Fardeau, Philippe Regreny, Michel Gendry, Solène Brottet, Nicholas P. Blanchard, Martin V. Holt, Marie‐Ingrid Richard, Alexandru Danescu, José Penuelas, Matthieu Bugnet

PMC · DOI: 10.1002/smtd.202500740 · Small Methods · 2025-08-07

## TL;DR

Scientists used advanced imaging to study how crystal structure changes in a single semiconductor nanowire affect its shape and properties.

## Contribution

The study reveals how crystal-phase changes in GaAs nanowires cause subtle deformations like twisting and bending.

## Key findings

- Twisting and bending in GaAs nanowires correlate with nanoscale phase distribution.
- Deformation mechanisms accommodate inter-reticular spacing fluctuations.
- Nanoscale phase changes affect nanowire properties relevant to nanophotonics and nanomechanics.

## Abstract

Engineering the properties of semiconductors by changing their crystalline phase is a technologically and economically relevant alternative to doping using foreign elements, with strong potential for photonic and electronic applications. Although major advances have been reported recently for crystal‐phase engineering of III‐V and group IV semiconductor nanowires, interfacing two mismatched crystalline phases in a nanostructure induces several deformation mechanisms, which remain largely unexplored. Here, using state‐of‐the‐art synchrotron X‐ray nanobeam diffraction and transmission electron microscopy, subtle twisting and bending is unveiled within an individual GaAs nanowire containing cubic and hexagonal segments. Their role is discussed in accommodating the inter‐reticular spacing fluctuations, and their variations are correlated to the nanoscale phase distribution and to the effect of the NW support. This study brings direct evidence of a complex combination of deformation mechanisms in biphasic nanowires, which opens a new path to tune the nanowire properties with appealing perspectives for device engineering in nanophotonics and nanomechanics.

Nano‐focused scanning X‐ray diffraction microscopy at a synchrotron light source, combined with transmission electron microscopy, reveals a clear correlation between the nanoscale distribution of cubic and hexagonal segments in a GaAs nanowire with subtle variations in inter‐reticular spacing, bending, and twisting. The interplay between deformation mechanisms and crystal structure, as well as the role of the NW support are discussed in the framework of linear elasticity.

## Full-text entities

- **Chemicals:** GaAs (MESH:C043055)

## Full text

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## Figures

5 figures with captions in the complete paper: https://tomesphere.com/paper/PMC12893255/full.md

## References

57 references — full list in the complete paper: https://tomesphere.com/paper/PMC12893255/full.md

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Source: https://tomesphere.com/paper/PMC12893255