# Deep Learning-Based 3D Reconstruction for Defect Detection in Shipbuilding Sub-Assemblies

## TL;DR

This paper explores using deep learning on 3D data to automatically detect defects in shipbuilding parts without needing labeled defect examples.

## Contribution

The novel contribution is evaluating and comparing deep learning architectures for unsupervised defect detection in shipbuilding sub-assemblies using 3D point clouds.

## Key findings

- Reconstruction-based anomaly detection on point clouds is viable for industrial defect identification.
- Different architectures vary in detection performance, stability, and computational cost.
- Isolation Forest applied to reconstruction errors effectively identifies overshooting defects.

## Abstract

Overshooting defects in shipbuilding subassemblies are essential to ensure the final product’s overall integrity and safety. In this work, we focus on the automatic detection of overshooting defects in simple and T-shaped sub-assemblies by employing reconstruction-based unsupervised learning on 3D point clouds. To this purpose, we implemented and compared four state-of-the-art architectures, including a Variational Autoencoder (VAE), FoldingNet, a Dynamic Graph CNN (DGCNN) autoencoder, and a PointNet++ autoencoder. These architectures were trained exclusively on defect-free samples, anticipating the possibility of overshooting defects occurring in different locations and with varying geometric patterns that are difficult to characterize explicitly in advance. Those defects are then identified by applying an Isolation Forest to the reconstruction error features, enabling fully unsupervised anomaly detection and allowing us to study how the detection performance changes with the contamination parameter. The results show that reconstruction-based anomaly detection on point clouds is a viable strategy for identifying defects in an industrial environment and the importance of choosing architectures that balance detection performance, stability across different geometries, and computational cost.