# TRIXS: a multilayer grating solution towards highly efficient resonant inelastic tender X-ray scattering

## TL;DR

A new multilayer grating design improves tender X-ray scattering efficiency, enabling broader and more precise material studies.

## Contribution

A novel multilayer grating optics design achieves high photon flux and energy resolution for tender X-ray RIXS.

## Key findings

- The MLG optics boost photon flux by over tenfold at key energy edges compared to single-layer gratings.
- The MLG maintains high energy resolution (~10,000) across the 2000–3000 eV tender X-ray range.
- The I21 beamline now covers both soft and tender X-rays using a grating-based spectrometer for diverse applications.

## Abstract

Resonant inelastic X-ray scattering (RIXS) is a photon-in/photon-out spectroscopic technique which has become increasingly important for the condensed matter physics community. The development of the RIXS instrumentation in soft X-ray and hard X-ray range facilitated the research in 3d and 5d transition metal (TM)-based materials, respectively. However, the tender X-ray (2000–3000 eV) RIXS covering most of 4d TM-based materials severely falls behind due to the lack of high-performance energy dispersive optics. Here, we demonstrate the design and fabrication of a laterally graded multilayer grating (MLG) optics for the establishment of the tender RIXS at the I21 RIXS beamline in Diamond Light Source. The successful implementation of the MLG boosts the photon flux by more than an order of magnitude at the Sulfur K-edge (2475 eV) and the Ru L3-edge (2838 eV) in comparison to the solution of a single-layer coated grating (SLG). More importantly, MLG retains the high energy resolution of the SLG design (~10,000) and works continuously across the full range of 2000–3000 eV. It renders the I21 beamline as the very first RIXS facility in the world that covers both soft and tender X-rays (280–3000 eV) using a grating-based spectrometer for a wide range of science applications.

Multilayer-grating-based spectrometer with high photon flux and moderate energy resolution for tender X-ray