# Highly Efficient and Stable Quantum Dot Light-Emitting Diodes Employing Sputtered SnO2 Layer as Electron Transport Layers

**Authors:** Jaehwi Choi, Jiwan Kim

PMC · DOI: 10.3390/nano16010031 · Nanomaterials · 2025-12-25

## TL;DR

This paper introduces a new method for making efficient and stable quantum dot light-emitting diodes using sputtered SnO2 layers.

## Contribution

The use of sputtered SnO2 as an electron transport layer in QLEDs is novel and improves performance and stability.

## Key findings

- SnO2 thin films with O2 gas improve charge balancing in QLEDs.
- Oxygen vacancies in SnO2 act as exciton quenching sites, affecting device stability.
- Optimized QLEDs achieved a peak luminance of 99,212 cd/m2 and a current efficiency of 21.17 cd/A.

## Abstract

We report a novel approach to fabricating high-performance and robust quantum dot light-emitting diodes (QLEDs) utilizing sputtered SnO2 thin films as the electron transport layer (ETL). While conventional solution-processed ZnMgO NP ETLs face limitations in mass production, the sputtering process offers advantages for uniform and reproducible thin film deposition. Herein, the structural, optical, and electrical properties of SnO2 thin films were optimized by controlling the Ar/O2 ratio and substrate heating temperature during sputtering. SnO2 thin films with O2 gas improve charge balancing in QLEDs by lowering the conduction band minimum. Furthermore, it was observed that oxygen vacancies in SnO2 function as exciton quenching sites, which directly impacts the long-term stability of the device. QLEDs fabricated under optimal conditions (Ar/O2 = 35:5, 200 °C heating) achieved a peak luminance of 99,212 cd/m2 and a current efficiency of 21.17 cd/A with excellent device stability. The findings suggest that sputtered SnO2 ETLs are a highly promising technology for the commercial production of QLEDs.

## Linked entities

- **Chemicals:** SnO2 (PubChem CID 29011)

## Full-text entities

- **Chemicals:** ZnMgO (-), O2 (MESH:D010100), Ar (MESH:D001128), SnO2 (MESH:C045358)

## Full text

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## Figures

9 figures with captions in the complete paper: https://tomesphere.com/paper/PMC12788106/full.md

## References

25 references — full list in the complete paper: https://tomesphere.com/paper/PMC12788106/full.md

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Source: https://tomesphere.com/paper/PMC12788106