Automated high-throughput high-resolution X-ray diffraction capabilities at SSRL BL 2-1

TL;DR

This paper introduces a high-throughput X-ray diffraction system at SSRL BL 2-1 that enables rapid structural analysis of complex materials like high entropy oxides.

Contribution

The paper demonstrates the use of a mail-in program with robotic automation for high-resolution structural studies of compositionally complex materials.

Findings

The mail-in program at SSRL BL 2-1 can process up to 100 samples per day with high resolution.

High-quality synchrotron data from the mail-in program resolved subtle phase separation in high entropy spinel oxides.

The system provides accessible and efficient structural characterization for challenging materials.

Abstract

High quality powder diffraction data from synchrotron radiation sources remain the cornerstone of structural characterization. They provide insights into the structure of materials; revealing subtle local and average structural details that could otherwise be missed by X-ray laboratory sources. However, high quality diffraction data from many synchrotron radiation sources are not easily accessible. From proposal writing to data collection, the process could take months. Financial and geographical limitations can compound the accessibility problem. The turn-around time for high throughput, mail-in program is significantly shorter than that of an in-person, general user program and is relatively easily accessible.

At the Stanford Synchrotron Radiation Light Source on beamline 2-1, the mail-in program, facilitated by a robotic sample changer can measure up to a 100 ex situ samples a day, delivering high throughput and high-resolution data for users [1]. In this work, as a case study, we have worked on high entropy oxides. These are compositionally complex, multifunctional materials that have shown great promise [2]. However, the compositional complexity of these materials makes them challenging to understand at the fundamental level and are prone to phase separation. The phase separation could be subtle and hard to resolve, requiring the high-resolution and high signal-to-noise ratio offered by synchrotron radiation sources. In this work, we have shown how the high-quality data from beamline 2-1, obtained through the mail-in program, could be used to resolve some phase separation observed in high entropy spinel oxides.