Mega-electron-volt Microcrystal Electron Diffraction
Xiaozhe Shen, Duan Luo, Xijie Wang

TL;DR
This paper introduces a new technique called MeV microED for atomic-scale structure characterization of 2D molecular crystals with high resolution and low electron dose.
Contribution
The first demonstration of MeV microED for resolving the atomic structure of a 2D molecular crystal (C6-DPA) with sub-angstrom resolution.
Findings
MeV microED achieved a spatial resolution better than 1 Å for C6-DPA under low-dose conditions.
The technique used a total dose of 1.1E−2 e-/Å2, minimizing damage to the sample.
The study outlines protocols for data acquisition and structure refinement using MeV microED.
Abstract
Characterization of atomic structure in matter benefits significantly from mega-electron-volt (MeV) electron beams, which offer enhanced penetration depths and substantially reduced multiple scattering effects compared to conventional kilo-electron-volt (keV) electron beams. MeV ultrafast electron diffraction (UED) has demonstrated broad and transformative impacts in ultrafast science, covering the field of condensed matter physics [1-4], and gas-phase [5-6] as well as liquid-phase chemistry [7-8]. Recent advancements in generation of micro- focused MeV beam [9] and the development of single-MeV-electron-sensitive detector [10] have paved the way for a novel application frontier: MeV microcrystal electron diffraction (microED). In this presentation, we report the first demonstration of MeV microED to atomic-scale structure characterization of a two-dimensional molecular crystal (2DMC)…
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Taxonomy
TopicsX-ray Spectroscopy and Fluorescence Analysis · Advanced Electron Microscopy Techniques and Applications · Nuclear Physics and Applications
