MLG-STPM: Meta-Learning Guided STPM for Robust Industrial Anomaly Detection Under Label Noise
Yu-Hang Huang, Sio-Long Lo, Zhen-Qiang Chen, Jing-Kai Wang

TL;DR
This paper introduces MLG-STPM, a new method for industrial image anomaly detection that improves performance when training data have noisy labels.
Contribution
MLG-STPM enhances STPM by using a meta-learning inspired guidance mechanism with an Evolving Meta-Set to reduce label noise impact.
Findings
MLG-STPM outperforms STPM in anomaly detection under synthetic label noise up to 20%.
The method achieves competitive results against other approaches on MVTec AD and VisA datasets.
The Evolving Meta-Set helps maintain high-confidence samples without needing clean data.
Abstract
Industrial image anomaly detection (IAD) is crucial for quality control, but its performance often degrades when training data contain label noise. To circumvent the reliance on potentially flawed labels, unsupervised methods that learn from the data distribution itself have become a mainstream approach. Among various unsupervised techniques, student–teacher frameworks have emerged as a highly effective paradigm. Student–Teacher Feature Pyramid Matching (STPM) is a powerful method within this paradigm, yet it is susceptible to such noise. Inspired by STPM and aiming to solve this issue, this paper introduces Meta-Learning Guided STPM (MLG-STPM), a novel framework that enhances STPM’s robustness by incorporating a guidance mechanism inspired by meta-learning. This guidance is achieved through an Evolving Meta-Set (EMS), which dynamically maintains a small high-confidence subset of…
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Taxonomy
TopicsMachine Learning and Data Classification · Anomaly Detection Techniques and Applications · Industrial Vision Systems and Defect Detection
