# Determining Accurate Pore Structures of Polypropylene Membrane for ECMO Using FE-SEM Under Optimized Conditions

## TL;DR

This study presents a method to accurately observe the pore structures of polypropylene membranes used in ECMO using FE-SEM under optimized conditions.

## Contribution

The study introduces optimized FE-SEM conditions to minimize morphological changes during observation of non-conductive porous structures.

## Key findings

- LEI mode at low voltage and long working distance effectively observed the convex surface of the PP membrane without sputtering.
- Non-sputtering methods are beneficial for preserving the structure of fragile porous materials during SEM observation.
- SEI mode at high magnification and appropriate voltage can visualize the deep parts of the sample with higher resolution.

## Abstract

Long-term ECMOs are expected to be put into practical use in order to prepare for the next emerging severe infectious diseases after the novel coronavirus pandemic in 2019–2023. While polypropylene (PP) and polymethylpentene (PMP) are currently the mainstream materials for the hollow fiber membranes of ECMO, the PP membrane coated with a silicone layer on the outer surface has also been commercialized. In this study, we sought a method to accurately observe the detailed pore morphologies of the PP membrane by suppressing irreversible changes in the morphology in SEM observation, which is a general-purpose observation with higher resolution. As a result, the convex surface morphologies of the PP membrane, which was a non-conductive porous structure, were confirmed in detail by utilizing the lower secondary electron image (LEI) mode (FE-SEM, JSM-7610F, JEOL Ltd., Tokyo, Japan) at low acceleration voltage, low magnification, and long working distance, to minimize morphological alterations caused by osmium (Os) sputtering. On the other hand, although the sputter-coating on non-conductive samples is mandatory for imaging morphologies with SEM, the non-sputtering method is also worthwhile for porous and fragile structures such as this sample to minimize morphological alterations. Furthermore, we propose a method to confirm the morphology of the deep part of the sample by utilizing the secondary electron image (SEI) mode at an appropriate acceleration voltage and high magnification with higher resolution.