Protocol for measuring the Young’s modulus of organoids using atomic force microscopy
Tianzhen Zhang, Lina Ma, Shen Ling, Yupeng Chen, Zhongtao Zhang, Dan Tian, Yingchi Yang

TL;DR
This paper provides a detailed protocol for measuring the stiffness of organoids using atomic force microscopy, improving the reliability of biomechanical studies.
Contribution
A standardized protocol for measuring organoid stiffness via AFM with optimized probe and force-curve analysis is introduced.
Findings
A protocol combining OCT embedding and AFM improves organoid stiffness measurement reproducibility.
Force-curve analysis using Hertz contact models enables accurate Young’s modulus quantification.
The method addresses mechanical gaps in organoid studies, expanding biomechanical research capabilities.
Abstract
Atomic force microscopy (AFM) is extensively applied to measure cell and tissue mechanics but lacks a standardized organoid stiffness assessment. Here, we present a protocol for quantifying the Young’s modulus of organoids via AFM, combining force-curve analysis with an optimized probe. We describe steps for preparing organoids, OCT embedding, slicing, AFM detection, and force-curve analysis. By mechanically addressing gaps in organoids, this protocol improves reproducibility and expands the capabilities of biomechanical research. •Steps to perform atomic force microscopy on organoids•Instructions for embedding organoids with OCT gel•Guidance on analyzing AFM-measured organoid curves using Hertz contact models Steps to perform atomic force microscopy on organoids Instructions for embedding organoids with OCT gel Guidance on analyzing AFM-measured organoid curves using Hertz contact…
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Taxonomy
TopicsForce Microscopy Techniques and Applications · Adhesion, Friction, and Surface Interactions · Near-Field Optical Microscopy
