Bearingless Inertial Rotational Stage for Atomic Force Microscopy
Eva Osuna, Aitor Zambudio, Pablo Ares, Cristina Gómez-Navarro, Julio Gómez-Herrero
TL;DR
A new lightweight rotational stage for AFM achieves high precision and reliable performance for scanning probe microscopy.
Contribution
A novel inertial rotational stage is introduced, offering high angular precision and compatibility with AFM systems.
Findings
The stage achieves a maximum rotational speed of 0.083 rad/s and a minimum angular step of 11.8 μrad.
The stage demonstrates reliable performance with continuous operation over extended periods.
Testing within an AFM setup confirms its efficacy for scanning probe microscopy.
Abstract
We introduce a novel rotational stage based on inertial motion, designed to be lightweight, compact, and fully compatible with atomic force microscopy (AFM) systems. Our characterization of this stage demonstrates high angular precision, achieving a maximum rotational speed of 0.083 rad/s and a minimum angular step of 11.8 μrad. The stage exhibits reliable performance, maintaining continuous operation for extended periods. When tested within an AFM setup, the stage deliveres excellent results, confirming its efficacy for scanning probe microscopy studies.
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Taxonomy
TopicsForce Microscopy Techniques and Applications · Mechanical and Optical Resonators · Near-Field Optical Microscopy