# Improved Test Fixture for Collecting Microcontact Performance and Reliability Data

## TL;DR

The paper introduces a new test fixture for MEMS microcontacts that enables high-speed testing and improves the evaluation of their performance and reliability.

## Contribution

An improved microcontact test fixture with high actuation rates and precise control for evaluating MEMS switch reliability is developed.

## Key findings

- The test fixture successfully collected microcontact performance data with forces ranging from 200–1000 µN.
- Microcontacts survived over 200 million cycles at 1 KHz with stable contact resistance between 3.8–5.2 Ω.

## Abstract

Microelectromechanical systems (MEMS) ohmic contact switches are considered to be a promising candidate for wireless communication applications. The longevity of MEMS switches is directly related to the reliability and performance of microcontacts. In this work, an improved microcontact test fixture with high actuation rates (KHz) and highly precise position control (nm) and force (nN) control was developed. Here, we collected microcontact performance data from initial contact tests (ICT) and microcontact reliability data from cold switched tests (CST). To perform these tests with our test fixture, we fabricated MEMS microcontact test structures with relatively high Young’s modulus electroplated Nickel (Ni)-based, fixed–fixed beam structure with Au/RuO2 bimetallic microcontacts. These structures were characterized for forces ranging from 200–1000 µN in ICT tests. In a CST test, the tested microcontact survived more than 200 million cycles at a 1 KHz cycle rate, with a stable contact resistance value ranging between 3.8–5.2 Ω. These experiments validate the potentiality of our microcontact test fixture, and will facilitate further investigation on advanced microcontacts to enhance the MEMS switch’s reliability.