Nanoscale Thermal Imaging of Dislocation-Mediated Heat Transport
Ruilin Mao, Bingyao Liu, Jiaxin Liu, Xiaoyue Gao, Junping Luo, Fachen Liu, Ruochen Shi, Jiade Li, Jinlong Du, Peng Gao

TL;DR
This study uses advanced microscopy to directly measure and analyze nanoscale heat transport at individual dislocations in SrTiO3, revealing localized thermal resistance and atomic-scale mechanisms.
Contribution
It provides the first direct nanoscale measurement of thermal resistance at individual dislocation cores and elucidates the atomic-scale origin of dislocation-mediated heat transport.
Findings
Temperature drop of 47 K across dislocation array
Localized thermal resistance concentrated at dislocation cores
Two-scale heat transport with core-dominated and extended effects
Abstract
Dislocations in crystalline materials are widely exploited to tailor the thermal conductivity of semiconductors and thermoelectrics, yet a critical gap persists: direct measurement of local thermal resistance at individual buried dislocations, along with its spatial extent, remains elusive due to the limitations of conventional thermal probes. Here, we use in situ scanning transmission electron microscopy-electron energy-loss spectroscopy to map nanoscale temperature distributions across a low-angle SrTiO3 grain boundary with periodic dislocation arrays. Our results reveal a temperature drop of 47 K across the dislocation array. The associated temperature-field distortions are concentrated near the dislocation cores, consistent with stronger local thermal resistance at these discrete sites rather than a uniformly distributed resistance along the array. We further identify a distinct…
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