When Accuracy Is Not Enough: Uncertainty Collapse between Noisy Label Learning and Out-of-Distribution Detection
Ningkang Peng, Jingyang Mao, Runhan Zhou, Peirong Ma, and Yanhui Gu

TL;DR
This paper reveals that high accuracy in noisy label learning does not guarantee reliable out-of-distribution detection due to uncertainty collapse, and proposes Virtual Margin Regularization to mitigate this issue.
Contribution
It introduces an ACC-OOD benchmark for evaluating noisy label learners on OOD detection and proposes VMR to improve OOD reliability without sacrificing accuracy.
Findings
High closed-set accuracy does not ensure OOD reliability.
Uncertainty collapse causes overlap between in-distribution errors and OOD inputs.
VMR partially mitigates the collapse and improves OOD detection.
Abstract
Learning with noisy labels (LNL) is typically benchmarked by closed-set classification accuracy, yet deployment often requires classifiers to reject out-of-distribution (OOD) inputs. We present a learner-agnostic ACC-OOD benchmark that freezes LNL checkpoints and evaluates them with standardized near-/far-OOD routing and post-hoc scores across synthetic and real label noise. The benchmark reveals a recurring failure mode: high closed-set accuracy does not ensure OOD reliability, because low-confidence, misclassified in-distribution samples can overlap the score and feature regions occupied by OOD inputs under noisy training. We term this pathology uncertainty collapse. This structural overlap can make high-accuracy LNL methods lose separability at the ID-error/OOD interface under standard OOD scores. As an intervention, we study Virtual Margin Regularization (VMR), a lightweight repair…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
