Hybrid Quantum-MambaVision: A Quantum-enhanced State Space Model for Calibrated Mixed-type Wafer Defect Detection
Satwik Sai Prakash Sahoo, Jyoti Prakash Sahoo, Ting Wang, Subrota Kumar Mondal

TL;DR
This paper presents Hybrid Quantum-MambaVision, a novel quantum-enhanced spatial model for wafer defect detection that improves accuracy and calibration in imbalanced industrial datasets.
Contribution
It introduces a scalable hybrid quantum-classical architecture combining a linear-complexity backbone with a quantum adapter for enhanced defect classification.
Findings
Achieves high multi-label classification accuracy on the MixedWM38 dataset.
Reduces maximum calibration error and false-positive costs.
Demonstrates efficient spatial dependency modeling with quantum integration.
Abstract
Extracting actionable knowledge from industrial visual data is fundamentally bottlenecked by extreme class imbalance and the prohibitive computational complexity of modern foundation models. In semi-conductor manufacturing, identifying multi-label wafer defects is a complex spatial data mining task where overlapping patterns obscure critical root-cause signals. While Vision Transformers (ViTs) excel at global dependency extraction, their quadratic scaling renders them inefficient for high-throughput, real-time anomaly detection. To overcome these computational barriers, this paper introduces Hybrid Quantum-MambaVision, a highly efficient architecture tailored for spatial knowledge discovery. We integrate a linear-complexity State-Space Model (SSM) backbone with a Parameterized Quantum Context Adapter (QCA) and Low-Rank Adaptation (LoRA). The Mamba backbone efficiently captures…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
