MBP-KT: Learning Global Collaborative Information from Meta-Behavioral Pattern for Enhanced Knowledge Tracing

TL;DR

This paper introduces MBP-KT, a framework that enhances knowledge tracing by capturing and utilizing meta-behavioral patterns from learners' interaction sequences to improve predictive accuracy.

Contribution

The paper proposes a novel meta-behavioral sequence construction and a parameter-free module for extracting global collaborative information, improving knowledge tracing models.

Findings

MBP-KT consistently improves performance across various KT models.

Meta-behavioral patterns effectively preserve learning behavioral information.

The framework demonstrates robustness on real-world datasets.

Abstract

The emerging collaborative information-based knowledge tracing (KT) has been a promising way to enhance modeling of learners' knowledge states. The core idea is to extract the collaborative information from interaction sequences of other learners to assist the prediction on the target one. Despite effectiveness, existing methods are built on the raw interaction sequences with tailored modules, which inevitably limits their capacity in deeply capturing learning behavioral patterns and generalization. To this end, we propose a general meta-behavioral pattern-aware framework (MBP-KT) for KT. Specifically, MBP-KT introduces a novel meta-behavioral sequence construction to transform the raw interaction sequences into the combinations of different meta-behavioral patterns. In this way, the learning behavioral patterns of learners can be effectively preserved. Then, MBP-KT develops a parameter-free module to extract the global collaborative representations from the constructed meta-behavioral sequences. Moreover, MBP-KT provides general injection strategies to introduce the extracted global collaborative information into various downstream KT models, ensuring the universality of the collaborative information. Extensive results on real-world datasets demonstrate that MBP-KT can consistently boosts the performance of a wide range of KT models.