Real-IAD MVN: A Multi-View Normal Vector Dataset and Benchmark for High-Fidelity Industrial Anomaly Detection
Wenbing Zhu, Jianing Liang, Linjie Cheng, Yurui Pan, Zhuhao Chen, Qingwang Yan, Yudong Cheng, Jianghui Zhang, Mingmin Chi, Bo Peng

TL;DR
The paper introduces Real-IAD MVN, a high-fidelity multi-view normal map dataset for industrial anomaly detection, demonstrating improved defect detection over traditional sparse 3D data and establishing a new benchmark.
Contribution
It provides a novel multi-view normal map dataset capturing micro-detail geometric anomalies and proposes a baseline reconstruction method that outperforms existing multimodal fusion techniques.
Findings
Dense multi-view normal maps improve defect detection accuracy.
The proposed baseline surpasses state-of-the-art multimodal methods.
The dataset enables detection of subtle geometric defects.
Abstract
Industrial Anomaly Detection (IAD) is critical for quality control, but existing methods struggle with subtle, geometric defects. Standard 2D (RGB) images are sensitive to texture and lighting but often miss fine geometric anomalies. While 3D point clouds capture macro-shape, they are typically too sparse to detect micro-defects like scratches or pits. We address this fundamental data limitation by introducing Real-IAD-MVN (Multi-View Normal), a large-scale industrial dataset. By upgrading our acquisition system, Real-IAD-MVN captures high-fidelity surface normal maps from five distinct viewpoints, replacing sparse 3D data entirely. This provides a comprehensive geometric representation at a micro-detail level, making previously invisible side-wall and occluded defects explicitly detectable. Our experiments, conducted on this new dataset, first provide evidence that incorporating dense,…
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