Stability of Charge Collection Efficiency in a Novel Graphene-Optimized Silicon Carbide Detector Under 160 keV X-Ray Irradiation
Yingjie Huang, Congcong Wang, Jingxuan He, Yi Zhan, Zhenyu Jiang, Xiyuan Zhang, Xin Shi

TL;DR
This study demonstrates that a graphene-optimized silicon carbide detector maintains high charge collection efficiency and fast response under 160 keV X-ray irradiation up to 1 MGy, indicating strong radiation hardness for demanding applications.
Contribution
The paper introduces a novel graphene-optimized silicon carbide detector with proven stability and performance under high-dose X-ray irradiation, advancing radiation-hard detector technology.
Findings
Charge collection efficiency remains above 90% after 1 MGy irradiation.
Rise times increase slightly but stay within fast response range.
Leakage current shows minimal change under irradiation.
Abstract
A novel graphene-optimized silicon carbide PIN detector was fabricated. Its electrical properties, charge collection performance and signal rise time were evaluated under non-irradiated conditions and under X-ray irradiation with an energy of 160 keV at doses of 0.1 MGy and 1 MGy. The leakage currents of the detectors under non-irradiated, 0.1 MGy, and 1 MGy irradiation conditions are approximately 1.45e-10 A, 1.51e-10 A, and 1.57e-10 A, respectively. The effective doping concentration of the detector is approximately 8.08e13 cm^-3 before and after irradiation, with no significant change. The rise times of the signals from alpha particles signal detected by the detector under unirradiated, 0.1 MGy, and 1 MGy X-ray irradiation conditions are 336 ps, 368 ps, and 387 ps, respectively. The rise times of the beta particles signal detected by the detector under unirradiated, 0.1 MGy, and 1…
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