SemiConLens: Visual Analytics for 2D Semiconductor Discovery
Kavinda Athapaththu, Shiwei Chen, Yuan Fang, Sanchali Mitra, Yee Sin Ang, Yong Wang

TL;DR
SemiConLens is a visual analytics tool that combines machine learning and human expertise to facilitate reliable discovery of new 2D semiconductor materials, addressing data scarcity and trust issues.
Contribution
It introduces a novel correlation-aware imputation method and an interactive visualization framework for effective 2D semiconductor discovery with limited data.
Findings
SemiConLens improves the reliability of semiconductivity predictions.
The visualization module enables interactive filtering and comparison of candidates.
Expert evaluations confirm its effectiveness in material discovery.
Abstract
The past few years have witnessed vibrant efforts in discovering new two-dimensional (2D) semiconductor materials from both academia and the industry, due to their promising potential in resolving the severe performance deterioration of traditional semiconductors resulting from condensed silicon thickness. However, existing methods (e.g., Density Functional Theory (DFT) or machine-learning-based approaches) suffer from various challenges such as small datasets, and reliability and trustworthiness issues. To bridge this gap, we propose SemiConLens, a visual analytics approach to combine human expertise with the power of ML to enable effective and reliable 2D semiconductor discovery. Specifically, we first develop a new Correlation Aware Multivariate Imputation (CAMI) method and use ML models like autoencoder, which can better learn from limited data and reveal uncertainty, to address the…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
