Mean Testing under Truncation beyond Gaussian
Yuhao Wang, Roberto Imbuzeiro Oliveira, and Themis Gouleakis

TL;DR
This paper characterizes the limits of high-dimensional mean testing under arbitrary data truncation, identifying detectability thresholds and proposing near-optimal tests that adapt to structural assumptions.
Contribution
It introduces a unified framework for mean testing under truncation, establishing fundamental limits and near-optimal procedures across different structural regimes.
Findings
Truncation induces a bias that creates a detectability threshold.
A simple second-order test achieves near-optimal sample complexity above the threshold.
Under median regularity, bias improves to linear order, enabling classical testing rates.
Abstract
We characterize the fundamental limits of high-dimensional mean testing under arbitrary truncation, where samples are drawn from the conditional distribution for an unknown truncation set that may hide up to an -fraction of the probability mass. For distributions with -th directional moments of magnitude at most , truncation induces a bias of order . This bias creates a sharp information-theoretic detectability floor: when the signal falls below this threshold, the null and alternative hypotheses are indistinguishable even with infinite data. Above this floor, we prove that a simple second-order test achieving near-optimal sample complexity . We further identify a structural escape from this finite-moment…
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