Quality-Driven Selective Mutation for Deep Learning
Zaheed Ahmed, Emmanuel Charleson Dapaah, Philip Makedonski, Jens Grabowski

TL;DR
This paper introduces a probabilistic framework for selecting high-quality mutants in deep learning testing, balancing resistance and realism to reduce costs while maintaining mutant effectiveness.
Contribution
It proposes a novel dual-objective quality measure for mutants and demonstrates its effectiveness in reducing mutant generation costs in deep learning.
Findings
Quality-driven selection reduces mutants by up to 55.6%.
The framework effectively balances resistance and realism.
Empirical evaluation on four datasets validates the approach.
Abstract
Mutants support testing and debugging in two roles: (i) as test goals and (ii) as substitutes for real faults. Hard-to-kill mutants provide better guidance for test improvement, while realism is essential when mutants are used to simulate real bugs. Building on these roles, selective mutation for deep learning (DL) aims to reduce the cost of mutant generation and execution by choosing operator configurations that yield resistant and realistic mutants. However, the DL literature lacks a unified measure that captures both aspects. This study presents a probabilistic framework to quantify mutant quality along two complementary axes: resistance and realism. Resistance adapts the classical notion of hard-to-kill mutants to the DL setting using statistical killing probabilities, while realism is measured via the generalized Jaccard similarity between mutant and real-fault detectability…
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