Experimentally-validated multi-slice simulation of electron diffraction patterns
Xinke Xiao, Tianle Ma, Lingxuan Shao (SJTU), Jun Liu, Qiwei Shi (SJTU), Canying Cai, St\'ephane Roux (LMPS)

TL;DR
This study enhances the multi-slice electron diffraction simulation method, MS5, and validates it against experimental EBSD patterns, enabling more accurate defect characterization in materials.
Contribution
It optimizes the multi-slice method with higher-order expansions and demonstrates its accuracy through experimental validation, a first in the field.
Findings
MS5 achieves a good balance between computational cost and pattern accuracy.
MS5, combined with distortion correction, matches experimental EBSD patterns.
First experimental validation of multi-slice EBSD simulations is presented.
Abstract
High-Resolution Electron Backscatter Diffraction (HR-EBSD) has advanced rapidly in recent years, significantly improving elastic strain measurements and dislocation density evaluation with submicron spatial resolution. To achieve better accuracy in the measurements, high-quality dynamical simulation patterns are required to be matched with experimental ones. Currently, the most widely used pattern simulation method, the Bloch Wave method (BW), can accurately predict the positions and brightness of Kikuchi poles and bands, but is intrinsically limited to perfect crystal structures. Another simulation scheme, the multi-slice method (MS), follows the evolution of electron waves as they travel through the sample. MS is advantageous in simulating various defect structures with more diffraction details. Yet, it is mainly considered for theoretical developments and has not been compared to…
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