SemiFA: An Agentic Multi-Modal Framework for Autonomous Semiconductor Failure Analysis Report Generation
Shivam Chand Kaushik

TL;DR
SemiFA is an innovative multi-modal framework that autonomously generates detailed semiconductor failure analysis reports in under a minute by integrating images, telemetry, and historical data.
Contribution
It introduces SemiFA, the first system to combine equipment telemetry with vision-language models for automated semiconductor failure analysis report generation.
Findings
Achieves 92.1% accuracy in defect classification.
Generates complete FA reports in 48 seconds on an NVIDIA A100 GPU.
Multi-modal fusion improves root cause reasoning over image-only models.
Abstract
Semiconductor failure analysis (FA) requires engineers to examine inspection images, correlate equipment telemetry, consult historical defect records, and write structured reports, a process that can consume several hours of expert time per case. We present SemiFA, an agentic multi-modal framework that autonomously generates structured FA reports from semiconductor inspection images in under one minute. SemiFA decomposes FA into a four-agent LangGraph pipeline: a DefectDescriber that classifies and narrates defect morphology using DINOv2 and LLaVA-1.6, a RootCauseAnalyzer that fuses SECS/GEM equipment telemetry with historically similar defects retrieved from a Qdrant vector database, a SeverityClassifier that assigns severity and estimates yield impact, and a RecipeAdvisor that proposes corrective process adjustments. A fifth node assembles a PDF report. We introduce SemiFA-930, a…
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