Wavelength-dependent photo-creep in halide perovskite single crystals

TL;DR

This study reveals how different wavelengths of light influence the photo-creep behavior of halide perovskite single crystals, showing suppression or enhancement of creep linked to ion migration and carrier trapping.

Contribution

It demonstrates wavelength-dependent photo-creep phenomena in CsPbBr3 and FAPbBr3 crystals and links these effects to ion migration and carrier trapping mechanisms.

Findings

Green light suppresses creep by 19% in CsPbBr3 and 10% in FAPbBr3.

Violet light enhances creep by 16% in CsPbBr3 and 8% in FAPbBr3.

Wavelength tuning affects ion migration and carrier trapping, controlling photo-creep.

Abstract

Halide perovskites are promising optoelectronic materials, but their time-dependent permanent deformation under illumination (i.e., photo-creep) is poorly understood, limiting their mechanical stability. Here we report wavelength-dependent photo-creep phenomena in CsPbBr3 and FAPbBr3 single crystals, studied by constant-load nanoindentation under controlled light with various wavelengths. Compared with creep in dark, continuous green light (near-bandgap) suppresses creep by 19% in CsPbBr3 and 10% in FAPbBr3, whereas violet (far above-bandgap) light enhances creep by 16% in CsPbBr3 and 8% in FAPbBr3. In contrast, when light is onset during creep, blue light enhances creep most prominently, whereas green light exhibits minimal influence. Such photo-creep behavior in halide perovskites are distinct with photo-plasticity phenomenon in conventional semiconductors. By combining the photoluminescence and photocurrent measurements, we unveil that ion migration promotes dislocation climb and creep, while carrier trapping suppresses dislocation glide and related creep in halide perovskites. Such competition between carrier trapping and ion migration tuned by wavelength governs the photo-creep response. Our findings uncover a photomechanical effect in halide perovskites and highlight how coupled carrier and ion dynamics under illumination affect their device reliability.