A Data-Driven Fast Simulation Approach for MAPS-based Detectors and their Optimization

TL;DR

This paper introduces a fast, measurement-based parametric simulation tool for pixel sensors, validated on MALTA2, aiding in detector optimization without detailed manufacturing data.

Contribution

It presents a novel, efficient simulation approach that relies solely on measurement input, enabling large-scale detector system analysis and sensor optimization.

Findings

Validated simulation for MALTA2 sensor shows accurate performance prediction.

Sensor modifications in hit merger improve tracking and calorimetry performance.

The approach facilitates sensor redesign in different manufacturing processes.

Abstract

A parametric simulation tool for pixel sensors is presented. A realistic pixel response is simulated purely based on measurement input, without requiring detailed knowledge of the underlying manufacturing process. As such, it provides an efficient alternative to the use of Technology Computer-Aided Design simulations, which typically depend on proprietary process information. Due to its parametric approach, the package is fast and thus particularly useful for larger detector systems and high hit rate environments. This work presents measurements, simulation and its validation for the MALTA2 sensor. It is a small collection electrode monolithic active pixel sensor produced in the Tower 180nm Complementary Metal-Oxide-Semiconductor imaging process. Modifications to the sensor's periphery, mainly in the hit merger, are studied in order to optimize the performance for tracking and calorimetry. This optimization is of special interest as part of the MALTA3 sensor redesign in the 65nm Tower Partners Semiconductor Co. process.