High-Temperature and High-Speed Atomic Force Microscopy Using a qPlus Sensor in Liquid via Quadpod Scanner and Hybrid-Loop Frequency Demodulation
Yuto Nishiwaki, Toru Utsunomiya, Takashi Ichii

TL;DR
This paper presents a high-temperature, high-speed atomic force microscopy technique using a qPlus sensor and hybrid frequency demodulation, enabling atomic-resolution imaging of molten metal/solid interfaces above 200°C.
Contribution
The development of a robust high-temperature, high-speed AFM system with a novel scanner and demodulation method for atomic-resolution imaging in liquid environments.
Findings
Achieved atomic-resolution imaging of molten Ga/PtGa_x interface at ~210°C.
Developed a Quadpod scanner with high resonant frequencies for thermal drift tolerance.
Established a hybrid-loop frequency demodulation technique with wider bandwidth.
Abstract
Atomic-resolution imaging on molten metal/solid interfaces at temperatures above 200 {\deg}C was achieved using a high-temperature, high-speed atomic force microscope (AFM) equipped with a qPlus sensor. A tip-scanning high-speed Quadpod scanner for a large mass load of qPlus sensor (2.3 g) was developed to enhance thermal drift tolerance by high-speed scanning and thermal insulation from the heated specimen. This scanner has dominant resonant frequencies of 7.05 kHz (lateral) / 29.7 kHz (vertical) without a load. In addition, the Hybrid-loop frequency demodulation technique for low-resonant-frequency () sensors with a wider bandwidth than conventional phase-locked loop was also established, providing a demodulation bandwidth of without exceeding the theoretical noise of the input deflection signal. Combining these techniques enabled…
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