3D Gaussian Splatting for Annular Dark Field Scanning Transmission Electron Microscopy Tomography Reconstruction
Beiyuan Zhang, Hesong Li, Ruiwen Shao, Ying Fu

TL;DR
This paper introduces DenZa-Gaussian, a novel 3D Gaussian Splatting method tailored for sparse-view ADF-STEM tomography, improving reconstruction quality and reducing artifacts in limited-view scenarios.
Contribution
It adapts 3D Gaussian Splatting to ADF-STEM tomography by modeling local scattering, stabilizing across tilt angles, and incorporating a Fourier-based loss for artifact suppression.
Findings
High-fidelity reconstructions at 45 and 15 views
Better alignment of 2D projections with original tilts
Robustness under sparse-view conditions
Abstract
Analytical Dark Field Scanning Transmission Electron Microscopy (ADF-STEM) tomography reconstructs nanoscale materials in 3D by integrating multi-view tilt-series images, enabling precise analysis of their structural and compositional features. Although integrating more tilt views improves 3D reconstruction, it requires extended electron exposure that risks damaging dose-sensitive materials and introduces drift and misalignment, making it difficult to balance reconstruction fidelity with sample preservation. In practice, sparse-view acquisition is frequently required, yet conventional ADF-STEM methods degrade under limited views, exhibiting artifacts and reduced structural fidelity. To resolve these issues, in this paper, we adapt 3D GS to this domain with three key components. We first model the local scattering strength as a learnable scalar field, denza, to address the mismatch…
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