Thermal fluctuations set fundamental limits on ion channel function
Jose M. Betancourt, Benjamin B. Machta

TL;DR
Thermal fluctuations impose fundamental limits on ion channel voltage sensing, affecting single-channel accuracy and collective information capacity, with implications for neuronal computation.
Contribution
This work quantifies how shot noise and Johnson-Nyquist noise set fundamental sensing limits in ion channels, linking physical noise sources to neuronal information processing.
Findings
Shot noise dominates at the single-channel level, limiting voltage sensing accuracy to about 10 mV.
Johnson-Nyquist noise overtakes shot noise at higher channel densities, constraining collective sensing.
The identified noise limits align with measured neuronal channel densities, influencing neuronal computation.
Abstract
Voltage-gated ion channels are essential for propagating signals in neurons. Each channel senses the local membrane potential created by nearby ions. Fluctuations in these ions introduce two fundamental noise sources: (i) shot noise, from the discreteness of ionic charge, and (ii) Johnson-Nyquist noise, from long-wavelength thermal fluctuations of the electric field. We show that, for an individual channel, shot noise dominates and sets an intrinsic limit to voltage sensing. On the s timescales relevant to channel gating, this limit corresponds to an accuracy of about mV -- close to measured channel sensitivities. When signals from many channels are aggregated, Johnson-Nyquist noise eventually overtakes shot noise and bounds the total information that can be sensed from the environment. This transition occurs at an ion channel density of channel/m for slow…
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