X-ray Response of the Fully-Depleted, p-Channel SiSeRO-CCD

TL;DR

This paper demonstrates that the SiSeRO CCD achieves sub-electron noise and efficient charge collection in a thick, fully depleted silicon detector, enabling broad-range X-ray spectroscopy with high resolution.

Contribution

It presents the first X-ray characterization of a fully depleted, p-channel SiSeRO CCD, showing its capability for high-resolution spectroscopy across a broad energy range.

Findings

Achieved 54 eV energy resolution at 5.9 keV for single-pixel events.

Extended spectral response observed between 9-26 keV and at 59.5 keV.

Charge transport consistent with interactions throughout the full sensor depth.

Abstract

We present an X-ray characterization of a fully depleted, 725 $\mu$m thick p-channel SiSeRO CCD. Measurements with a $^{55}$Fe source yield an energy resolution of $54 \pm 0.9$ eV ($14.6 \pm 0.25 e^{-}$) at 5.9 keV for single-pixel events, demonstrating that the SiSeRO amplifier preserves the intrinsic charge resolution of the CCD under multi-sample non-destructive readout. Characterization with a $^{241}$Am source extends the response to higher-energy photons, with reconstructed spectral features observed between 9-26 keV and the 59.5 keV $\gamma$ emission. These measurements, together with a muon-derived diffusion calibration, show that charge transport and diffusion are consistent with interactions spanning the full sensor depth. These results demonstrate that the SiSeRO CCD simultaneously achieves sub-electron noise performance and efficient charge collection in a thick, fully depleted silicon detector. This combination enables X-ray spectroscopy across a broad energy range while maintaining sensitivity to faint signals.