Using Fast Reading Current Integrator for Advanced Ion Beam Diagnostics Across Continuous and Pulsed Modes
I-Chun Cho, Chien-Hsu Chen, Huan Niu, Cheng-Ya Pan, Chun-Hui Hsing, Tung-Yuan Hsiao

TL;DR
This paper introduces a high-speed, low-noise current integrator for ion beam diagnostics capable of real-time, high-resolution measurements in both continuous and pulsed modes, enhancing beam analysis and control.
Contribution
A novel hybrid digitization system combining charge-balancing and voltage-to-frequency conversion for fast, accurate ion beam current measurement with real-time feedback capabilities.
Findings
Achieves 0.5 ms temporal resolution in ion beam measurements.
Demonstrates stable, linear operation with high timing fidelity.
Enables fast beam-interrupt signals within 1 microsecond.
Abstract
A fast-reading current integrator is developed for high time-resolution and low-noise ion beam diagnostics under both continuous-wave and pulsed operating conditions. The system combines a low-leakage transimpedance front-end with a hybrid digitization architecture based on charge-balancing and voltage-to-frequency conversion. The input current is converted into a pulse stream corresponding to discrete charge quanta, enabling event-driven measurement with temporal resolution down to 0.5 ms while preserving a wide dynamic range and high linearity. The system further enables real-time pulse selection for instantaneous dose-rate estimation and reconstruction of time-dependent beam structures. A deterministic beam-interrupt signal is generated within <1 us upon reaching a predefined charge threshold, enabling fast feedback control. Additional functionalities, including threshold- and…
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