A general framework for the study of electrostatic point charges in multilayer planar structures
George Fikioris, Theodoros T. Koutserimpas, Elias N. Glytsis

TL;DR
This paper presents a comprehensive framework for analyzing electrostatic point charges in multilayer planar structures, extending classical image theory to complex regimes with negative permittivities and non-diverging solutions.
Contribution
It introduces a generalized reflection coefficient approach and a phantom-image method, broadening the applicability and computational efficiency of electrostatic analysis in layered media.
Findings
Extended classical image theory to negative permittivities.
Derived integral representations for non-unique solutions.
Proposed a finite-source approximation for large-reflection regimes.
Abstract
We develop a general framework for the electrostatic analysis of point charges in multilayer planar structures with arbitrary layer thicknesses and material parameters. Starting from a Hankel-transform analysis, we derive alternative representations of the solution and establish a Stokes-like formulation based on ``generalized reflection coefficients,'' yielding a systematic and physically transparent treatment of multilayer media. This approach extends classical image theory to parameter regimes in which the conventional image-charge series (which has an infinite number of terms) diverges. The formulation applies to arbitrary permittivity values, including negative permittivities, where overscreening effects and plasmon-resonant conditions may occur. In these regimes, we show that the boundary-value problem no longer has a unique solution because homogeneous (source-free) modes appear;…
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