Azimuthal super-pupil beam engineering for improved fluorescence depletion microscopy

TL;DR

This paper introduces a novel azimuthally polarized, doughnut-shaped depletion beam design for fluorescence microscopy, achieving tighter central minima through super-pupil engineering and phase modulation techniques.

Contribution

It presents a new method to engineer depletion beams with improved spatial confinement using phase-only SLMs and Bessel-type pupil functions.

Findings

Achieved approximately 16% reduction in the central doughnut size.

Demonstrated the feasibility of using super-pupil engineering for better resolution.

Engineered beams show potential for enhanced super-resolution microscopy.

Abstract

Fluorescence depletion microscopy techniques such as STED and RESOLFT require optical fields with a well-defined and spatially confined central intensity minimum to achieve sub-diffraction lateral resolution. Here, we present the design and experimental implementation of an azimuthally polarized, doughnut-shaped depletion beam based on super-pupil engineering principles. By tailoring the radial amplitude distribution at the entrance pupil to approximate a Bessel-type target function, the resulting focal field exhibits a tighter central doughnut compared to conventional azimuthally polarized beams. The designed pupil field distribution is implemented using a phase-only spatial light modulator operated in a double pass configuration, enabling independent modulation of orthogonal polarization components via complex-field holographic encoding. Experimental characterization using sub-diffraction fluorescent beads demonstrates a reduction of the peak-to-peak distance of the central doughnut by approximately 16% relative to a nominal azimuthally polarized reference beam. Although the engineered field exhibits pronounced sidelobes, these do not preclude its use as a depletion beam, since lateral resolution is strongly influenced by the spatial confinement and effective suppression of the central intensity minimum for a given depletion intensity. This suggests that the proposed approach can enable improved lateral resolution at comparable depletion powers, providing a flexible and experimentally accessible route for engineering depletion fields in reconfigurable super-resolution microscopy systems.