EPAR: Electromagnetic Pathways to Architectural Reliability in Quantum Processors

TL;DR

EPAR is a framework that predicts the impact of electromagnetic design choices on the reliability of quantum processors, enabling early assessment and improved robustness through physical layout analysis.

Contribution

EPAR introduces a novel electromagnetic-to-architecture modeling approach that links physical design distortions to quantum processor robustness, surpassing traditional metrics.

Findings

EPAR's scores align perfectly with two-qubit error trends.

Reveals over 10X robustness differences among similar edges.

Provides actionable guidance for compiler optimization.

Abstract

As superconducting processors scale, understanding how physical layout shapes qubit interactions is essential for architectural reliability. Existing methods offer limited insight into how electromagnetic design choices translate into execution-level behavior. We present EPAR, an electromagnetic-to-architecture framework that predicts robustness early directly from physical design by reconstructing how design distortion modifies the effective Hamiltonian, reroutes mediated connectivity, and influences control-pulse response. Across all tested layouts, EPAR's structural scores show 100% agreement with two-qubit error trends yet reveal over 10X robustness differences among edges with identical calibrated error rates, going beyond conventional metrics to provide improved and actionable compiler guidance.