Photoelectron angular distribution as a versatile polarization analyzer for soft and tender X-rays

TL;DR

This paper introduces a novel method for measuring the polarization of soft and tender X-rays (1.5-3.0 keV) using photoelectron angular distributions, enabling more versatile polarization analysis in this energy range.

Contribution

It presents a new technique based on photoelectron angular distribution measurements to determine X-ray polarization in the 1.5-3.0 keV range, expanding experimental capabilities.

Findings

Photoelectron angular distribution depends on photon polarization.

Method effective across 0.4 to 3.0 keV energy range.

Reliable polarization measurement tool developed.

Abstract

The polarization of soft and tender X-rays serves as a widely utilized probe for investigating diverse physical properties, such as magnetic order in materials. However, experimental methods for determining the polarization of tender X-rays (1.5-3.0 keV) have remained limited. In this work, we propose a polarization measurement method for this energy range based on the photoelectron angular distribution. The angular distribution of photoelectrons emitted from carbon targets was measured using linearly polarized synchrotron radiation. The results showed a clear dependence on the incident photon polarization across the energy range of 0.4 to 3.0 keV. This demonstrates that the photoelectron angular distribution can serve as a reliable tool for determining the linear polarization of soft and tender X-ray photons, facilitating the development of polarization-dependent measurements across this broad energy range.